اخبار > مطالعه میکروسکپی کاوشگری جاروبی(Scanning Probe Microscopy) سطوح سرامیک های عاملی و بس عاملی


 


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سمینارهای هفتگی انجمن علمی دانشجویی فیزیک

مطالعه میکروسکپی کاوشگری جاروبی(Scanning Probe Microscopy) سطوح سرامیک های عاملی و بس عاملی

Abstract The most versatile tool to study the surface properties of the thin films and nanostructures is the scanning probe microscopy (SPM). Upon changing the scanning probes and modes, various forces between surface and probe such as atomic, electrostatic, piezoelectric and magnetic forces are recorded during the raster scan of the surface. Recorded forces are processed to obtain the images which provide information about the surface morphology, surfaces charges, ferroelectric and magnetic domains, respectively. In this seminar, SPM investigations such as magnetic force microscopy (MFM), piezoelectric force microscopy (PFM) and electrostatic force microscopy (EFM) studies on the surfaces of the functional and multifunctional ceramics will be presented


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